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[Analysis Case] Contamination Analysis in Vacuum Equipment

It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!

Vacuum devices that utilize the characteristic of low gas molecular density in a space are used in various applications such as thin film formation and surface analysis in the manufacturing process of electronic components. Since the chamber of a vacuum device is a closed space, the presence of trace amounts of molecules can easily cause contamination within the device. To suppress contamination, it is necessary to conduct investigations to identify contamination sources such as pumps, devices, and samples. This document presents a case study investigating contamination within a vacuum device using TOF-SIMS.

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  • Contract measurement
  • Surface treatment contract service
  • Time-of-flight mass spectrometer
  • Internal contamination analysis

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